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TPS20A Two-dimensional X-ray Diffraction Beamline

Yen-Chung Lai (賴彥仲)
National Synchrotron Radiation Research Center (國家同步輻射研究中心)

Abstract:

As contemporary materials science transitions from static structural identification to exploring the "dynamic evolution" of materials under external stimuli, high-performance experimental techniques have become critical. Developed by the National Synchrotron Radiation Research Center (NSRRC), the TPS 20A beamline is a state-of-the-art platform specifically designed for high-throughput screening and excellent temporal resolution dynamic monitoring. Utilizing a bending magnet source, it delivers tunable X-ray energy ranging from 8 to 30 keV. At an energy of 10 keV, the photon flux reaches approximately 6X1011 photons/s with a focused spot size of 300umX300um, significantly enhancing diffraction signal quality and drastically reducing data acquisition time.
In terms of endstation configuration, TPS 20A balances the needs for high throughput and high precision. For large-scale powder analysis, the station features an automatic capillary alignment system paired with a robotic arm to enable fully automated sample exchange. For non-standard samples such as thin films or in-situ reaction chambers, a high-load six-axis parallel kinematic positioning stage (Hexapod) provides exceptional stiffness and micron-level stability across six degrees of freedom. Furthermore, the endstation is fully integrated with comprehensive in-situ environmental equipment, including high/low-temperature controllers, potentiostats for electrochemical studies, and gas loading systems. The detection system utilizes a large-area, high-resolution Eiger2 S 16M photon-counting detector, overcoming the slow readout and high noise limitations of traditional image plates.
Currently, TPS 20A has officially opened for user operations, while the research team simultaneously continues commissioning tasks—including system integration, optimization, and testing of various experimental setups—to ensure optimal beamline performance. Strategically cooperating with the TPS 19A beamline, which focuses on high-resolution structural analysis, TPS 20A is gradually absorbing the user community from the existing TLS 01C2 beamline. Previous validation tests using a LaB6 standard demonstrated extremely low background noise and an exceptional signal-to-noise ratio. Fully active now, this facility serves as a powerful tool for the materials research community, driving deep exploration into functional materials, energy storage systems, and frontier physical properties.

Keywords – X-ray diffraction, In-situ XRD

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